The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Dec. 14, 2018
Applicant:

Institute of Chemistry Chinese Academy of Sciences, Beijing, CN;

Inventors:

Jinghe Yuan, Beijing, CN;

Jianqiang Yu, Beijing, CN;

Xiaohong Fang, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/0076 (2013.01);
Abstract

An illumination system for a STED optical microscope includes an illumination light path consisting of an illumination light source and an optical elements. The illumination light path includes a first light filter, a second light filter, a polarizing light splitter, a first quarter wave plate, a first dichroic element, a light path delay unit, a phase plate, a second dichroic element, and a second quarter wave plate arranged in sequence along the transmission direction of the light path. The light beam emitted from the illumination light source is divided into two coaxial light beams after transmitted by the illumination light path. A first light beam is incident to a microscope objective to form a first light spot, a second light beam is incident to the microscope objective to form a second light spot, and the center of the first light spot coincides with that of the second light spot.


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