The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Mar. 31, 2020
Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

Urcan Guler, West Lafayette, IN (US);

Alexander V. Kildishev, West Lafayette, IN (US);

Krishnakali Chaudhury, West Lafayette, IN (US);

Shaimaa Ibrahim Azzam, West Lafayette, IN (US);

Esteban E. Marinero-Caceres, West Lafayette, IN (US);

Harsha Reddy, West Lafayette, IN (US);

Alexandra Boltasseva, West Lafayette, IN (US);

Vladimir M. Shalaev, West Lafayette, IN (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B82Y 20/00 (2011.01); G02B 1/00 (2006.01); G01N 21/84 (2006.01); B82Y 30/00 (2011.01); B82Y 40/00 (2011.01);
U.S. Cl.
CPC ...
G02B 1/002 (2013.01); G01N 21/8422 (2013.01); B82Y 20/00 (2013.01); B82Y 30/00 (2013.01); B82Y 40/00 (2013.01); G01N 2021/8427 (2013.01);
Abstract

An optical sensor system, comprising refractory plasmonic elements that can withstand temperatures exceeding 2500° C. in chemically aggressive and harsh environments that impose stress, strain and vibrations. A plasmonic metamaterial or metasurface, engineered to have a specific spectral and angular response, exhibits optical reflection characteristics that are altered by varying physical environmental conditions including but not limited to temperature, surface chemistry or elastic stress, strain and other types of mechanical load. The metamaterial or metasurface comprises a set of ultra-thin structured layers with a total thickness of less than tens of microns that can be deployed onto surfaces of devices operating in harsh environmental conditions. The top interface of the metamaterial or metasurface is illuminated with a light source, either through free space or via an optical fiber, and the reflected signal is detected employing remote detectors.


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