The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2023
Filed:
Jun. 05, 2020
Applicant:
Faro Technologies, Inc., Lake Mary, FL (US);
Inventors:
Assignee:
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06K 9/00 (2022.01); G06K 9/52 (2006.01); G01S 17/89 (2020.01); G06V 20/64 (2022.01); G06V 10/30 (2022.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G06F 18/2148 (2023.01); G06V 10/30 (2022.01); G06V 20/64 (2022.01); G06V 20/647 (2022.01); G06V 2201/121 (2022.01);
Abstract
A system and a method for removing artifacts from a 3D coordinate data are provided. The system includes one or more processors and a measuring device. The one or more processors are operable to receive training data and train the 3D measuring device to identify artifacts by analyzing the training data. The one or more processors are further operable to identify artifacts in live data based on the training of the processor system. The one or more processors are further operable to generate clear scan data by filtering the artifacts from the live data and output the clear scan data.