The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2023
Filed:
Dec. 11, 2020
Raytheon Technologies Corporation, Farmington, CT (US);
David L. Lincoln, Cromwell, CT (US);
Jose-Rodrigo Castillo-Garza, West Hartford, CT (US);
Raytheon Technologies Corporation, Farmington, CT (US);
Abstract
A method of foreign object debris discrimination incudes illuminating particulates located within a sensing volume with a first electromagnetic radiation pulse emitted from a first source, and illuminating the particulates within the sensing volume with a second electromagnetic radiation pulse emitted from a second source, wherein the second electromagnetic radiation pulse has a second wavelength range within the terahertz (THz) regime. The first electromagnetic radiation returns and the second electromagnetic radiation returns are compared to determine a scattering ratio from the comparing step. The scattering ratio is then utilized to determine a resultant foreign object debris type of the solid objects.