The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Dec. 11, 2020
Applicant:

Alcon Inc., Fribourg, CH;

Inventors:

Arun Paudel, Berlin, DE;

Olaf Kittelmann, Berlin, DE;

Matthias Foesel, Memmelsdorf, DE;

Assignee:

Alcon Inc., Fribourg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G02B 21/00 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3103 (2013.01); G02B 21/002 (2013.01); G02B 26/10 (2013.01);
Abstract

The disclosure provides a system that may: provide multiple first portions of a laser beam to an objective lens of an optical system; provide the multiple first portions of the laser beam to respective multiple locations of a test surface; receive multiple second portions of the laser beam from the test surface; determine multiple intensities respectively associated with the multiple second portions of the laser beam; transform the multiple intensities into data that represents multiple measurement values of the multiple intensities; determine, from the data, if an intensity value of the multiple intensities is below a threshold intensity value; if the intensity is below the threshold intensity value, provide information that indicates an issue associated with the objective lens; and if the intensity is not below the threshold intensity value, provide information that indicates there is no issue associated with the objective lens.


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