The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Jan. 19, 2019
Applicant:

Beijing Didi Infinity Technology and Development Co., Ltd., Beijing, CN;

Inventors:

Tingbo Hou, Santa Clara, CA (US);

Yanke Wang, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01); G01C 21/34 (2006.01);
U.S. Cl.
CPC ...
G01C 21/387 (2020.08); G01C 21/3461 (2013.01); G01C 21/3837 (2020.08);
Abstract

Systems and methods involving obtaining point cloud data from one or more sources corresponding to one or more zones within a real-world space, the point cloud data representing surface features of structures detected within the one or more zones; defining a plurality of first-level nodes based on the point cloud data, individual first-level nodes corresponding to obtained point cloud data corresponding to individual zones of the one or more zones; identifying connections between two or more first-level nodes, the connections between the two or more first-level nodes based on connections between the point cloud data for the zones corresponding to the two or more first-level nodes; and defining a plurality of second-level nodes, individual second-level nodes corresponding to aggregated subsets of first-level nodes for which connections are identified.


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