The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Jul. 01, 2020
Applicant:

Topcon Corporation, Tokyo, JP;

Inventor:

You Sasaki, Tokyo, JP;

Assignee:

Topcon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/481 (2006.01); G01C 15/00 (2006.01); G01C 15/06 (2006.01); G01S 17/42 (2006.01);
U.S. Cl.
CPC ...
G01C 15/006 (2013.01); G01C 15/06 (2013.01); G01S 7/4817 (2013.01); G01S 17/42 (2013.01);
Abstract

Reselection of an instrument point, due to the limited emission range of a scanning laser light, is performed with decreased burden. A total station equipped with a laser scanner has a combined structure of a total station and a laser scanner. The total station equipped with the laser scanner includes a point cloud data acquiring unit, a distance acquiring unit, and an instrument point calculator. The point cloud data acquiring unit acquires point cloud data that is obtained through laser scanning performed by the laser scanner set up at a first instrument point. The distance acquiring unit acquires a distance to the laser scanner of each point in the point cloud data. The instrument point calculator calculates a location of a second instrument point on the basis of an upper limit of the distance.


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