The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2023
Filed:
Jun. 05, 2020
Illinois Tool Works Inc., Glenview, IL (US);
Adrian Charles Riddick, Medfield, MA (US);
Nicholas Francisco Salerno, Brighton, MA (US);
Michael Ashman, Natick, MA (US);
Christian J. Hoehl, Ober-Ramstadt, DE;
Illinois Tool Works Inc., Glenview, IL (US);
Abstract
The present disclosure describes systems and methods for conducting deformation (e.g., extension and/or strain) measurements based on characteristics of a test specimen using light sourced from a single side of a test specimen. The light source and an imaging device are arranged on a single side of the test specimen relative to a back screen while the light source illuminates both a front surface of the test specimen and the back screen. The back screen reflects light to create a silhouette of the test specimen. The imaging device captures images of one or more markers on a front surface of the test specimen, as well as measuring position of the markers during the testing process. The imaging device also measures relative changes in position of the edges of the test specimen during the testing process, by analyzing the edges of the silhouetted image created by the reflective back screen.