The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Jul. 16, 2019
Applicant:

Dow Toray Co., Ltd., Tokyo, JP;

Inventors:

Hiroshi Fukui, Ichihara, JP;

Yoichi Kaminaga, Ichihara, JP;

Takeaki Tsuda, Ichihara, JP;

Assignee:

DOW TORAY CO., LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08G 77/00 (2006.01); B32B 27/06 (2006.01); B32B 27/28 (2006.01); C08G 77/20 (2006.01); C08J 5/18 (2006.01); C09J 7/38 (2018.01);
U.S. Cl.
CPC ...
C08G 77/70 (2013.01); B32B 27/06 (2013.01); B32B 27/283 (2013.01); C08G 77/20 (2013.01); C08J 5/18 (2013.01); C08J 2383/07 (2013.01); C09J 7/38 (2018.01); C09J 2483/00 (2013.01);
Abstract

An organopolysiloxane cured film which can be made thin, has an extremely low number of defects on a surface and inside of the film, and exhibits high dielectric breakdown strength with regard to a load voltage is provided. Also provided are applications thereof and a method of manufacturing. The organopolysiloxane cured film has an average thickness within a range of 1 to 200 μm. In general, the number of surface defects is 0 to 1, and the number of internal defects is 0 to 20, when measuring the number of surface defects using optical means in an arbitrary position on the organopolysiloxane cured film with a unit area of 15 mm×15 mm. The organopolysiloxane cured film may be obtained by a rolling step in a clean room or the like, or may be obtained by curing between separators provided with a release layer.


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