The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Nov. 21, 2017
Applicant:

Janssen Pharmaceutica NV, Beerse, BE;

Inventors:

Dai Wang, Bridgewater, NJ (US);

Srihari Gopal, Belle Mead, NJ (US);

Vaibhav Narayan, Princeton, NJ (US);

Adam Savitz, Greenwich, CT (US);

Susan Baker, Pennington, NJ (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/16 (2006.01); G01N 33/74 (2006.01); A61K 31/519 (2006.01); A61B 5/145 (2006.01); G01N 33/68 (2006.01); A61P 25/18 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/167 (2013.01); A61B 5/165 (2013.01); A61K 31/519 (2013.01); A61P 25/18 (2018.01); G01N 33/6869 (2013.01); G01N 33/6893 (2013.01); G01N 33/743 (2013.01); A61B 5/14546 (2013.01); A61B 5/4088 (2013.01); A61B 5/4839 (2013.01); A61B 5/7275 (2013.01); G01N 2333/5412 (2013.01); G01N 2333/7155 (2013.01); G01N 2800/302 (2013.01); G01N 2800/50 (2013.01); G01N 2800/54 (2013.01);
Abstract

The invention provides methods of identifying schizophrenia patients at risk for relapse. The invention also provides methods of early detection of schizophrenic relapse. The disclosed methods use monitoring of a subset of symptoms and/or one or more biomarkers. The symptom severity can be assessed using the Positive and Negative Syndrome Scale (PANSS) parameters. The methods of the invention can be used to provide early intervention to decrease or prevent relapse in schizophrenia patients.


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