The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Mar. 05, 2020
Applicant:

Oculus Optikgeraete Gmbh, Wetzlar, DE;

Inventor:

Andreas Steinmueller, Wettenberg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/13 (2006.01); A61B 3/107 (2006.01); A61B 3/103 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/103 (2013.01); A61B 3/1005 (2013.01); A61B 3/107 (2013.01); A61B 3/13 (2013.01);
Abstract

A method for testing the eyes of a test person with the aid of a vision testing system as well as to a vision testing system, comprising a first measuring device, a second topographic measuring device, a third refractive measuring device and a processing means, a central axial length (L) and a peripheral axial length (L) of an eye of the test person being measured with the aid of said first measuring device, a curvature of the cornea of the eye being measured with the aid of said second measuring device, a refractive property of the eye being measured with the aid of said third measuring device, measurement data of the measurements of the first, second and third measuring device being processed with the aid of said processing means, said processing means outputting the measurement data.


Find Patent Forward Citations

Loading…