The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2023
Filed:
Apr. 07, 2021
Bank of America Corporation, Charlotte, NC (US);
Chie Khiong Chin, Singapore, SG;
Ayush Anand, Singapore, SG;
Harish Tammaji Kulkarni, Singapore, SG;
Simon Peter Lawrie, Singapore, SG;
Nhat Minh Nguyen, Singapore, SG;
Bank of America Corporation, Charlotte, NC (US);
Abstract
Aspects of the disclosure relate to a dynamic event securitization and neural network analysis system. A dynamic event inspection and securitization computing platform comprising at least one processor, a communication interface, and memory storing computer-readable instructions may securitize event data prior to authorizing execution of the event. A neural network event analysis computing platform comprising at least one processor, a communication interface, and memory storing computer-readable instructions may utilize a plurality of event analysis modules, a neural network, and a decision engine to analyze the risk level values of data sharing events. The dynamic event inspection and securitization computing platform may interface with the neural network event analysis computing platform by generating data securitization flags that may be utilized by the neural network event analysis computing platform to modify event analysis results generated by the event analysis modules.