The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

May. 24, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Saidhiraj Amuru, Bangalore, IN;

Hyun-Seok Ryu, Yongin-si, KR;

Anshuman Nigam, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/18 (2023.01); H04L 1/1812 (2023.01); H04L 1/1829 (2023.01); H04L 1/1867 (2023.01); H04W 72/23 (2023.01); H04W 76/27 (2018.01); H04W 72/044 (2023.01);
U.S. Cl.
CPC ...
H04L 1/1812 (2013.01); H04L 1/1854 (2013.01); H04L 1/1887 (2013.01); H04W 72/23 (2023.01); H04W 72/044 (2013.01); H04W 76/27 (2018.02);
Abstract

Embodiments herein provide a method for managing HARQ procedure for multiple numerologies multiplexing in a wireless communication network. The method includes transmitting, by a User Equipment (UE), capability parameters of the UE to a Base Station (BS). Further, the method includes receiving, by the UE, a plurality of HARQ configuration parameters corresponding to the capability parameters of the UE from the BS, and perfuming, by the UE, one of an individual HARQ process and a shared HARQ process based on the plurality of HARQ configuration parameters received from the BS.


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