The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Aug. 26, 2022
Applicant:

Synaptics Incorporated, San Jose, CA (US);

Inventors:

Kazutoshi Aogaki, Kanagawa, JP;

Hirobumi Furihata, Tokyo, JP;

Takashi Nose, Kanagawa, JP;

Assignee:

Synaptics Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/20 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/0285 (2013.01);
Abstract

A method includes generating first demura data comprising first correction amounts for pixels in a first region of a display panel. The first region has a first pixel density. The method further includes generating second demura data comprising second correction amounts for pixels in a second region of the display panel. The second region has a second pixel density different from the first pixel density. The method further includes generating modified second demura data by modifying the second correction amounts by a first factor. The method further comprises compressing the first demura data and the modified second demura data to generate compressed demura data. The method further includes providing the compressed demura data and factor information indicative of the first factor to a display driver.


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