The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Sep. 08, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Byungin Yoo, Seoul, KR;

Jingtao Xu, Beijing, CN;

Chao Zhang, Beijing, CN;

Hao Feng, Beijing, CN;

Yanhu Shan, Beijing, CN;

Youngjun Kwak, Seoul, KR;

Youngsung Kim, Suwon-si, KR;

Wonsuk Chang, Hwaseong-si, KR;

Jaejoon Han, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/40 (2022.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06V 40/45 (2022.01); G06V 40/161 (2022.01); G06V 40/169 (2022.01); G06V 40/172 (2022.01);
Abstract

A liveness test method and apparatus is disclosed. The liveness test method includes detecting a face region in an input image for a test target, implementing a first liveness test to determine a first liveness value based on a first image corresponding to the detected face region, implementing a second liveness test to determine a second liveness value based on a second image corresponding to a partial face region of the detected face region, implementing a third liveness test to determine a third liveness value based on an entirety of the input image or a full region of the input image that includes the detected face region and a region beyond the detected face region, and determining a result of the liveness test based on the first liveness value, the second liveness value, and the third liveness value.


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