The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2023
Filed:
Nov. 22, 2022
Applicant:
Raytheon Bbn Technologies Corp., Cambridge, MA (US);
Inventors:
Kin Chung Fong, Cambridge, MA (US);
Man-Hung Siu, Lexington, MA (US);
Zhuolin Jiang, Cambridge, MA (US);
Assignee:
RAYTHEON BBN TECHNOLOGIES CORP., Cambridge, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06N 3/04 (2023.01); C01B 32/19 (2017.01); G06F 18/24 (2023.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); C01B 32/19 (2017.08); G06F 18/24 (2023.01); G06N 3/0418 (2013.01); G06V 20/698 (2022.01);
Abstract
A method for classifying images of oligolayer exfoliation attempts. In some embodiments, the method includes forming a micrograph of a surface, and classifying the micrograph into one of a plurality of categories. The categories may include a first category, consisting of micrographs including at least one oligolayer flake, and a second category, consisting of micrographs including no oligolayer flakes, the classifying comprising classifying the micrograph with a neural network.