The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Dec. 13, 2021
Applicant:

University of Florida Research Foundation, Inc., Gainesville, FL (US);

Inventors:

Swarup Bhunia, Gainesville, FL (US);

Abdulrahman Alaql, Gainesville, FL (US);

Aritra Dasgupta, Gainesville, FL (US);

Md Moshiur Rahman, Gainesville, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/14 (2013.01); G06F 21/12 (2013.01); G06F 21/75 (2013.01); G06F 21/72 (2013.01);
U.S. Cl.
CPC ...
G06F 21/123 (2013.01); G06F 21/14 (2013.01); G06F 21/72 (2013.01); G06F 21/75 (2013.01);
Abstract

The present disclosure provides systems and methods for timed unlocking and locking of hardware intellectual properties obfuscation. One such method includes determining whether received key inputs match a functional key sequence of an integrated circuit or a test key sequence of the integrated circuit; permanently enabling operation of the integrated circuit responsive to the received key inputs being determined to be a functional key sequence for permanently enabling operation of the integrated circuit; temporarily enabling operation of the integrated circuit responsive to the received key inputs being determined to be the test key sequence for temporarily enabling operation of the integrated circuit to perform testing of the functionality and disable thereafter; and locking sequential logic and combinational logic of the integrated circuit if the received key inputs are determined to not be either the functional key sequence or the test key sequence. Other systems and methods are also provided.


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