The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Aug. 10, 2022
Applicant:

Adobe Inc., San Jose, CA (US);

Inventors:

Anup Rao, San Jose, CA (US);

Tung Mai, San Jose, CA (US);

Matvey Kapilevich, Irvington, NY (US);

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/26 (2019.01); G06T 11/20 (2006.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/26 (2019.01); G06F 16/285 (2019.01); G06F 16/288 (2019.01); G06T 11/206 (2013.01);
Abstract

The present disclosure relates to systems, methods, and non-transitory computer-readable media that estimate the overlap between sets of data samples. In particular, in one or more embodiments, the disclosed systems utilize a sketch-based sampling routine and a flexible, accurate estimator to determine the overlap (e.g., the intersection) between sets of data samples. For example, in some implementations, the disclosed systems generate a sketch vector—such as a one permutation hashing vector—for each set of data samples. The disclosed systems further compare the sketch vectors to determine an equal bin similarity estimator, a lesser bin similarity estimator, and a greater bin similarity estimator. The disclosed systems utilize one or more of the determined similarity estimators in generating an overlap estimation for the sets of data samples.


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