The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Apr. 30, 2021
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Nathaniel G. McKervey, Tallahassee, FL (US);

Paul Jean André Bernier, Vancouver, CA;

Siegfried Puchbauer, San Francisco, CA (US);

Min Zhang, Vancouver, CA;

Assignee:

SPLUNK INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); H04L 9/32 (2006.01); H04L 9/00 (2022.01);
U.S. Cl.
CPC ...
G06F 16/2379 (2019.01); G06F 16/2365 (2019.01); H04L 9/3239 (2013.01); H04L 9/50 (2022.05);
Abstract

A machine data validation system can track and validate the integrity of machine data generated by machines. The system can generate hashes for the items and batch hashes that can be validated using an immutable data store, such as a blockchain. The system can implement a tiered blockchain structure to efficiently store and reference the hashes to validate the machine data at different times or upon request from an end-user.


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