The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2023
Filed:
Oct. 17, 2018
Coherent Logix, Incorporated, Austin, TX (US);
Geoffrey N. Ellis, Santa Cruz, CA (US);
John Mark Beardslee, Menlo Park, CA (US);
Michael B. Doerr, Dripping Springs, TX (US);
Ivan Aguayo, Austin, TX (US);
Brian A. Dalio, Keller, TX (US);
Coherent Logix, Incorporated, Austin, TX (US);
Abstract
System and method for testing a device under test (DUT) that includes a multiprocessor array (MPA) executing application software at operational speed. The application software may be configured for deployment on first hardware resources of the MPA and may be analyzed. Testing code for configuring hardware resources on the MPA to duplicate data generated in the application software for testing purposes may be created. The application software may be deployed on the first hardware resources. Input data may be provided to stimulate the DUT. The testing code may be executed to provide at least a subset of first data to a pin at an edge of the MPA for analyzing the DUT using a hardware resource of the MPA not used in executing the application software. The first data may be generated in response to a send statement executed by the application software based on the input data.