The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Nov. 11, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Karthik V Swaminathan, Mount Kisco, NY (US);

Ramon Bertran Monfort, New Orleans, LA (US);

Alper Buyuktosunoglu, White Plains, NY (US);

Pradip Bose, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3414 (2013.01); G06F 11/3075 (2013.01); G06F 11/3466 (2013.01);
Abstract

A computer-implemented method, a computer system and a computer program product customize generation and application of stress test conditions in a processor core. The method includes receiving a workload at the processor core, where the workload includes a plurality of instructions and the processor core comprises a plurality of macros. The method also includes obtaining macro performance data for each macro in the plurality of macros from the processor core. The method further includes determining a switching activity level for each macro in the plurality of macros when each instruction in the plurality of instructions is run based on the macro performance data. Lastly, the method includes generating a stressmark comprising the plurality of instructions in the workload, where the stressmark is associated with a macro in the plurality of macros when the switching activity level for the macro is above a minimum threshold.


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