The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Mar. 14, 2022
Applicant:

Seagate Technology, Llc, Fremont, CA (US);

Inventors:

Zheng Wang, Louisville, CO (US);

Ara Patapoutian, Hopkinton, MA (US);

Bengt Anders Ulriksson, Longmont, CO (US);

Assignee:

Seagate Technology LLC, Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/02 (2006.01); G06F 11/10 (2006.01); G11C 11/56 (2006.01); G06F 11/00 (2006.01); H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/008 (2013.01); G11C 11/5642 (2013.01); H03M 13/1111 (2013.01);
Abstract

Read parameter estimation techniques are provided that obtain information from multiple read operations to customize read parameters for data recovery. One method comprises performing the following steps, in response to a decoding failure of a codeword of the memory: obtaining at least three read values of the codeword; calculating a signal counts metric value from the at least three reads; computing an optimal reference voltage offset from the signal counts metric and a correlation between optimal reference voltage offsets and a signal counts metric associated with the memory; determining a new center read reference voltage based on a current center reference voltage and the optimal reference voltage offset and performing at least one subsequent read of the codeword following the decoding failure utilizing the new center read reference voltage.


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