The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Jul. 09, 2021
Applicant:

Ohio State Innovation Foundation, Columbus, OH (US);

Inventors:

Alper Yilmaz, Lewis Center, OH (US);

Nima Ajam Gard, Dublin, OH (US);

Ji Hyun Lee, Columbus, OH (US);

Tunc Aldemir, Columbus, OH (US);

Richard Denning, Columbus, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G05B 23/02 (2006.01); G05B 13/02 (2006.01); G21D 3/00 (2006.01); G21D 3/04 (2006.01); G06F 11/34 (2006.01); G06N 3/045 (2023.01);
U.S. Cl.
CPC ...
G05B 23/024 (2013.01); G05B 13/027 (2013.01); G06F 11/3495 (2013.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G21D 3/001 (2013.01); G21D 3/04 (2013.01); G05B 2219/32335 (2013.01);
Abstract

Systems and methods are described herein for real-time data processing and for emergency planning. Scenario test data may be collected in real-time based on monitoring local or regional data to ascertain any anomaly phenomenon that may indicate an imminent danger or of concern. A computer-implemented method may include filtering a plurality of different test scenarios to identify a sub-set of test scenarios from the plurality of different test scenarios that may have similar behavior characteristics. A sub-set of test scenarios is provided to a trained neural network to identify one or more sub-set of test scenarios. The one or more identified sub-set of test scenarios may correspond to one or more anomaly test scenarios from the sub-set of test scenarios that is most likely to lead to an undesirable outcome. The neural network may be one of: a conventional neural network and a modular neural network.


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