The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Jun. 15, 2020
Applicant:

Aramco Services Company, Houston, TX (US);

Inventors:

Shannon Lee Eichmann, Katy, TX (US);

Gary Eppler, Baytown, TX (US);

Joshua Brothers, Sealy, TX (US);

David Jacobi, Spring, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01); G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
G02B 21/34 (2013.01); G02B 21/26 (2013.01);
Abstract

A mounting device for holding a sample mounted to a sample holder for use in an inverted microscope. The mounting device includes a platen; a mounting located on a sample side of the platen; a sample holder removably coupled to the mounting so the sample is along an optical axis of the inverted microscope; and a spacer shaped as a hollow prism or a hollow cylinder having a height and defining a through hole. The platen is disposed on the spacer with the sample side facing toward the spacer and the sample holder positioned within the through hole. The height of the spacer arranges the sample within a focal plane of the inverted microscope.


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