The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Nov. 05, 2020
Applicant:

Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;

Inventors:

Kyosuke Kamada, Hokkaido, JP;

Yukie Tamura, Hokkaido, JP;

Fumiya Takeuchi, Hokkaido, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G02B 27/10 (2006.01); G01N 21/64 (2006.01); G01J 3/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0012 (2013.01); G01J 3/0221 (2013.01); G01J 3/28 (2013.01); G01N 21/64 (2013.01); G01N 21/6458 (2013.01); G02B 21/0028 (2013.01); G02B 21/0076 (2013.01); G02B 27/10 (2013.01); G01J 2003/003 (2013.01);
Abstract

Provided are an imaging unitthat uses a light emitted from a second beam splitterof a microscopethat can use an exciting light and an observation light, which is a light including a wavelength other than that of the exciting light, as a light source by switching there between and is provided with the second beam splitterto image images of the same observation region of the microscopein situations where the exciting light and the observation light are used as the light source and an output unitthat overlaps, synthesizes, and outputs the images imaged by the imaging unitrespectively using the exciting light and the observation light as the light source.


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