The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

May. 11, 2020
Applicant:

Denso Corporation, Kariya, JP;

Inventors:

Yoshihiro Abe, Kariya, JP;

Toshiaki Watanabe, Nagakute, JP;

Shinichiro Matsuzawa, Nagakute, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/118 (2015.01); B60R 1/00 (2022.01); G01S 13/931 (2020.01); G02B 1/115 (2015.01);
U.S. Cl.
CPC ...
G02B 1/118 (2013.01); B60R 1/001 (2013.01); G01S 13/931 (2013.01); G02B 1/115 (2013.01); G01S 2013/93276 (2020.01);
Abstract

An antireflection structure includes an antireflection film provided on a front surface of a substrate. The antireflection film has a plurality of holes that are spatially and periodically arranged and pass through front and back surfaces of the antireflection film. A thickness and a relative dielectric constant of the antireflection film are set according to a relative dielectric constant and a thickness of the substrate and an incident angle θ of an electromagnetic wave. The thickness and the relative dielectric constant of the antireflection film are set for an electromagnetic wave incident at the angle θ so that, for example, an electromagnetic wave reflected by the antireflection film provided on the front surface of the substrate and an electromagnetic wave reflected by a back surface of the substrate deviate from each other by a half wavelength and cancel each other.


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