The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Oct. 24, 2018
Applicant:

Baker Hughes Holdings Llc, Houston, TX (US);

Inventors:

Yinxi Zhang, Houston, TX (US);

Sushant Dutta, Houston, TX (US);

Assignee:

Baker Hughes Holdings LLC, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/32 (2006.01); G01V 99/00 (2009.01); G06N 20/00 (2019.01); E21B 47/00 (2012.01); E21B 49/00 (2006.01); E21B 49/08 (2006.01); E21B 47/003 (2012.01); G01V 3/38 (2006.01);
U.S. Cl.
CPC ...
G01V 3/32 (2013.01); E21B 47/003 (2020.05); E21B 49/00 (2013.01); E21B 49/087 (2013.01); G01V 3/38 (2013.01); G01V 99/005 (2013.01); G06N 20/00 (2019.01);
Abstract

A method includes obtaining a dielectric measurement of a portion of a downhole formation. The method also includes processing the dielectric measurement via a trained machine learning system. The method further includes determining at least one of a classification or a textural parameter simultaneously with formation water saturation of the downhole formation, via the machine learning system, based at least in part on the dielectric measurement. The machine learning system is based on a pre-determined dataset from previous measurements or simulated results of synthetic cases. The method determining the correlation between water saturation and formation texture through a frequency cascading training process based on sensitivity of complex dielectric spectrum with respect to desired parameters including water saturation and texture parameter. The method also includes assigning at least one of the classification or the textural parameter to the downhole formation.


Find Patent Forward Citations

Loading…