The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Nov. 18, 2020
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Avik Santra, Munich, DE;

Prachi Vaishnav, Munich, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/72 (2006.01); G01S 7/41 (2006.01); G01S 13/58 (2006.01);
U.S. Cl.
CPC ...
G01S 13/726 (2013.01); G01S 7/411 (2013.01); G01S 7/415 (2013.01); G01S 7/417 (2013.01); G01S 13/584 (2013.01);
Abstract

In an embodiment, a method for tracking targets includes: receiving data from a radar sensor of a radar; processing the received data to detect targets; identifying a first geometric feature of a first detected target at a first time step, the first detected target being associated to a first track; identifying a second geometric feature of a second detected target at a second time step; determining an error value based on the first and second geometric features; and associating the second detected target to the first track based on the error value.


Find Patent Forward Citations

Santra, Avik. (2023). Radar based tracker using empirical mode decomposition (emd) and invariant feature transform (ift) (U.S. Patent No. 11719805). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11719805

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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