The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Jun. 07, 2021
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventors:

Ariane Stiebeiner, Stuttgart, DE;

Georgio Balatzis, Fellbach, DE;

Simon Raab, Santa Barbara, CA (US);

Stefan Wagner, Renningen, DE;

Assignee:

FARO TECHNOLOGIES, INC., Lake Mary, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01); G01N 23/20025 (2018.01); G06F 30/20 (2020.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 23/20025 (2013.01); G06F 30/20 (2020.01); G01N 2223/3075 (2013.01);
Abstract

A system and method of inspecting a plurality of objects using a computed tomography (CT) system is provided. The method includes acquiring an image of a fixture used for holding the plurality of objects with the CT system. A first electronic model of the fixture is generated. The objects are placed in the fixture. An image of the fixture and the objects is acquired with the CT system. A second electronic model of the fixture and the objects is generated. A third electronic model of the objects is defined based at least in part on subtracting the first electronic model from the second electronic model. Dimensions of the objects from the third electronic model are compared with a computer aided design (CAD) model. A report is output based at least in part on the comparison of the objects from the third electronic model with the CAD model.


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