The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

May. 24, 2019
Applicant:

National Tsing Hua University, Hsinchu, TW;

Inventors:

Chun-Yu Chuang, Hsinchu County, TW;

Pin-Hsuan Yeh, Hsinchu County, TW;

Chao-Ming Tsen, Kaohsiung, TW;

Ching-Wei Yu, Taipei, TW;

Wei-Chung Chao, Hsinchu, TW;

Yung-Hsiang Wang, New Taipei, TW;

Cheng-Chien Li, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); C12Q 1/37 (2006.01); G01N 33/543 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
G01N 21/658 (2013.01); C12Q 1/37 (2013.01); G01N 33/5308 (2013.01); G01N 33/54373 (2013.01); G01N 2333/43582 (2013.01); G01N 2333/96413 (2013.01);
Abstract

A method for detecting dust mite antigens includes the steps of collecting a dust sample, applying an extraction and cleanup procedure for dust mite antigens from the dust sample in order to obtain a sample solution ready for measurement, and placing the sample solution on a SERS chip without immunological modification and under a Raman spectrometer for SERS detection in order to identify whether any dust mite antigens exist in the sample solution.


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