The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Jun. 27, 2018
Applicant:

Life Technologies Holdings Pte Ltd, Singapore, SG;

Inventors:

Katja Eklin, Espoo, FI;

Adyary Fallarero, Vantaa, FI;

Tommi Suvanto, Espoo, FI;

Marika J. Raitio, Helsinki, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01N 21/64 (2006.01); C12Q 1/686 (2018.01);
U.S. Cl.
CPC ...
G01N 21/6452 (2013.01); C12Q 1/686 (2013.01); G01N 21/253 (2013.01); G01N 2201/04 (2013.01); G01N 2201/0461 (2013.01); G01N 2201/0469 (2013.01);
Abstract

The method of analyzing one or more samples arranged in sample receptacles of a platform that is configured to receive a plurality of separate samples includes the steps of measuring electromagnetic radiation transmitted or emitted by each sample, repeating the measurement a plurality of times at predetermined intervals, on the basis of each measurement, forming a result matrix comprising a plurality of cells, each cell of the result matrix corresponding to a sample receptacle of the plat-form, wherein a measurement value of each sample is used as an input for determining the visual properties of the respective cell in the result matrix, and displaying the results as consecutive matrixes in respect of time.


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