The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Jul. 02, 2020
Applicant:

China Agricultural University, Beijing, CN;

Inventors:

Zhidan Liu, Beijing, CN;

Rui Yang, Beijing, CN;

Yufei Zeng, Beijing, CN;

Gangfeng Feng, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01); G01N 21/59 (2006.01); G06T 11/20 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/0303 (2013.01); G01N 21/59 (2013.01); G06T 11/206 (2013.01); G01N 2021/8405 (2013.01);
Abstract

The present invention belongs to the technical field of new energy detection, in particular to a material uniformity detection device and method. The purpose of the present invention is to provide a material uniformity detection device which can meet the requirement of detection of diversified materials such as biomass slurry aiming at the problem of difficulty in quantifying uniformity state of the biomass slurry. The sample pool is driven by the rotating lifting device for lifting and spiral motion, data collection is performed on the sample pool in the form of a certain path, and an image is established for the relationship between a large number of light intensity values of transmission light and heights measured for multiple times to respectively display the uniformity of horizontal layering and uniformity in the vertical direction, to judge the overall uniformity of the material samples.


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