The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2023
Filed:
Nov. 05, 2020
Applicant:
Vieworks Co., Ltd., Anyang-si, KR;
Inventors:
Young Ho Kim, Seoul, KR;
You Jung Kang, Anyang-si, KR;
Assignee:
Vieworks Co., Ltd., Anyang-si, KR;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 15/10 (2006.01); B01L 3/00 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); B01L 3/502784 (2013.01); G01N 15/1056 (2013.01); B01L 3/502715 (2013.01); G01N 2015/0065 (2013.01);
Abstract
Disclosed are an optical analysis device and an optical analysis method. The present invention provides an optical analysis device for optically analyzing a flow cell, including: a light source configured to emit light to the flow cell; an optical detector including a plurality of detection elements that detects optical signals from reaction regions of the flow cell; and an optical mask including light transmissive mask holes disposed at a front end of each of the detection elements, and an optical analysis method using the same.