The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2023
Filed:
Sep. 11, 2019
Applicant:
M-flow Technologies Limited, Abingdon, GB;
Inventors:
Alan David Parker, Abingdon, GB;
Giles Edward, Abingdon, GB;
Assignee:
M-Flow Technologies Limited, Abingdon, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 9/36 (2006.01); G01F 25/10 (2022.01); G01F 1/40 (2006.01); G01F 1/74 (2006.01); G01F 1/84 (2006.01); G01N 9/00 (2006.01); G01N 22/00 (2006.01); G01N 23/12 (2018.01); G01N 33/28 (2006.01);
U.S. Cl.
CPC ...
G01N 9/36 (2013.01); G01F 1/40 (2013.01); G01F 1/74 (2013.01); G01F 1/8436 (2013.01); G01F 25/10 (2022.01); G01N 9/002 (2013.01); G01N 22/00 (2013.01); G01N 23/12 (2013.01); G01N 33/2841 (2013.01);
Abstract
A method produces a void fraction (VF) error curve which correlates an apparent VF with the actual VF of a multi-phase flow, the method comprising (a) using a device to measure a property of the multi-phase flow from which an apparent VF may be calculated; (b) calculating the apparent VF using the measured property from the device; (c) determining the actual VF of the multiphase flow using a radiometric densitometer; (d) using the values from steps (b) and (c) to calculate the VF error; (e) repeating steps (b) through (d) for all expected flow conditions to generate a VF error curve.