The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Oct. 20, 2021
Applicant:

Renesas Electronics America Inc., Milpitas, CA (US);

Inventors:

Damla S. Acar, La Mesa, CA (US);

Pooja Agrawal, Milpitas, CA (US);

Ashley M. De Wolfe, San Diego, CA (US);

Gustavo James Mehas, Mercer Island, WA (US);

Nicholaus W. Smith, La Mesa, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/14 (2006.01); G06F 1/16 (2006.01); G06F 3/04845 (2022.01); G01D 5/20 (2006.01);
U.S. Cl.
CPC ...
G01B 7/14 (2013.01); G01D 5/20 (2013.01); G06F 1/1615 (2013.01); G06F 3/04845 (2013.01);
Abstract

Methods and systems for determining a position of a structure using inductive position sensing are described. In an example, a processor may receive a plurality of data points representing a plurality of voltages. The plurality of voltages may be generated by a plurality of sensor coils based on a magnetic flux field. The magnetic flux field may be generated by a plurality of driver coils, and the plurality of voltages may vary with changes in the magnetic flux field. The processor may calibrate the plurality of data points to generate a plurality of calibrated data points. The processor may filter the plurality of calibrated data points. The processor may estimate a position of the structure based on the filtered calibrated data points, where the position of the structure may indicate a size of a size changing device.


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