The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Aug. 29, 2022
Applicant:

Jiangnan University, Wuxi, CN;

Inventors:

Jiajia Fu, Wuxi, CN;

Weidong Gao, Wuxi, CN;

Zhenyue Liu, Wuxi, CN;

Xuerong Fan, Wuxi, CN;

Lei Wang, Wuxi, CN;

Yuzheng Lu, Wuxi, CN;

Chaoran Meng, Wuxi, CN;

Rong Li, Wuxi, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
D06C 27/00 (2006.01); D06C 9/00 (2006.01);
U.S. Cl.
CPC ...
D06C 27/00 (2013.01); D06C 9/00 (2013.01); D06C 2700/135 (2013.01); D10B 2201/02 (2013.01);
Abstract

The disclosure relates to the technical field of after-finishing of textile products, and in particular relates to a delayed-cure durable press finishing technology for cotton fabrics, including the following steps: singeing, desizing, liquid ammonia finishing, mercerizing, liquid ammonia finishing and post-cure finishing. The disclosure significantly improves the stability of a delayed-cure sensitized fabric during delayed-curing, relieves the problems caused by a slow reaction in the storage process of the delayed-cure sensitized fabric, and is favorable for improving the product quality.


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