The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2023
Filed:
Apr. 26, 2018
Taikisha Ltd., Tokyo, JP;
Keiji Manabe, Tokyo, JP;
Hiroyuki Suzuki, Tokyo, JP;
Hideo Shiwa, Tokyo, JP;
Genji Nakayama, Tokyo, JP;
Taikisha Ltd., Tokyo, JP;
Abstract
A three-dimensional shape measuring instrument is provided for measuring a three-dimensional shape of the polishing subject face. A polishing controller is provided for controlling a polishing robot alone or with a polishing tool, based on three-dimensional shape data of the polishing subject face obtained by the shape measurement by the three-dimensional shape measuring instrument. The polishing tool provides a polishing action on the respective part of the polishing subject face through controlling of the polishing robot alone or with the polishing tool by the polishing controller. By controlling a measuring robot and the three-dimensional shape measuring instrument by the polishing controller, the three-dimensional shape measuring instrument moves to a predetermined measuring position relative to the polishing subject face to measure the three-dimensional shape of the polishing subject face.