The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Apr. 23, 2018
Applicant:

Ifp Energies Nouvelles, Rueil-Malmaison, FR;

Inventors:

Sophie Bernadet, Merignac, FR;

Antoine Fecant, Brignais, FR;

Denis Uzio, Oullins, FR;

Renal-Vasco Backov, Bordeaux, FR;

Serge Ravaine, Cestas, FR;

Assignee:

IFP Energies nouvelles, Rueil-Malmaison, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01J 23/10 (2006.01); B01D 53/00 (2006.01); B01D 53/86 (2006.01); B01J 21/06 (2006.01); B01J 21/08 (2006.01); B01J 35/00 (2006.01); B01J 35/04 (2006.01); B01J 35/10 (2006.01);
U.S. Cl.
CPC ...
B01J 23/10 (2013.01); B01D 53/007 (2013.01); B01D 53/8671 (2013.01); B01J 21/063 (2013.01); B01J 21/08 (2013.01); B01J 35/004 (2013.01); B01J 35/0026 (2013.01); B01J 35/0033 (2013.01); B01J 35/04 (2013.01); B01J 35/1014 (2013.01); B01J 35/1019 (2013.01); B01J 35/1023 (2013.01); B01J 35/1038 (2013.01); B01J 35/1042 (2013.01); B01J 35/1047 (2013.01); B01J 35/1057 (2013.01); B01J 35/1061 (2013.01); B01J 35/1066 (2013.01); B01J 35/1071 (2013.01); B01J 35/1076 (2013.01); B01D 2255/2065 (2013.01); B01D 2255/20707 (2013.01); B01D 2255/30 (2013.01); B01D 2255/802 (2013.01); B01D 2255/9202 (2013.01); B01D 2255/9205 (2013.01); B01D 2255/9207 (2013.01); B01D 2257/504 (2013.01); B01D 2259/804 (2013.01);
Abstract

The invention relates to a photocatalytic carbon dioxide reduction method carried out in liquid and/or gas phase under irradiation, using a photocatalyst containing a first semiconductor, particles comprising one or more metallic-state elements M, and a second semiconductor SC, wherein the method is carried out by contacting a feedstock containing the COand at least one sacrificial compound with the photocatalyst, then irradiating the photocatalyst such that the COis reduced, and oxidising the sacrificial compound in order to produce an effluent containing at least in part C1 or above carbon molecules other than CO.


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