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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11717041 B1

PDFFull Text
Date of Patent:
Aug. 08, 2023

Filed:

Mar. 15, 2020

System and method of generating digital apparel size measurements

Applicant:

Short Circuit Technologies Llc, Rochester, NY (US);

Inventors:

Sankalp Sandeep Modi, Acton, MA (US);

Shailesh Nirgudkar, Acton, MA (US);

Assignee:

Other;

Attorneys:

Zaretsky Group PC

Howard Zaretsky

Primary Examiner:

Patrick E Demosky

Int. Cl.
CPC ...
G01F 17/00 (2006.01); A41H 1/02 (2006.01); G06T 17/00 (2006.01); G06F 30/17 (2020.01); A41H 1/00 (2006.01); A41H 43/00 (2006.01); G06T 17/20 (2006.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
A41H 1/02 (2013.01); A41H 1/00 (2013.01); A41H 43/005 (2013.01); G06F 30/17 (2020.01); G06T 17/00 (2013.01); G06T 17/20 (2013.01); G06T 19/20 (2013.01);
Abstract

A novel and useful system and method for measuring an article of clothing (AOC) that may include one or more of an apparel expander (AE) having an expansion chamber configured to be inserted into a cavity of the AOC and to receive an operating fluid (OPF), a fluid distribution unit (FDU) coupled to the AE and configured to control a supply of the OPF to, or from, the apparel expander, a sensor configured to detect contours of the AE when at least a portion of the AE is situated within the cavity of the AOC and form corresponding sensor information, and a controller configured to control the FDU to supply the OPF to the AE to expand the AE when at least a portion of the AE is situated within the cavity of AOC, obtain the sensor information from the sensor, reconstruct a three-dimensional (3D) model of the AOC based upon the detected contours of the AE obtained from the sensor information, and form digital size information (DSI) including information related to the reconstructed three-dimensional model.

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Modi, Sankalp. (2023). System and method of generating digital apparel size measurements (U.S. Patent No. 11717041). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11717041

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