The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Jul. 03, 2020
Applicant:

The Regents of the University of Michigan, Ann Arbor, MI (US);

Inventors:

Stephen R. Forrest, Ann Arbor, MI (US);

Caleb Coburn, Citrus Heights, CA (US);

Dejiu Fan, Ann Arbor, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H10K 39/32 (2023.01); H04N 25/53 (2023.01); H04N 25/71 (2023.01); H04N 25/75 (2023.01); H10K 30/30 (2023.01); H10K 30/82 (2023.01); H10K 85/20 (2023.01);
U.S. Cl.
CPC ...
H10K 39/32 (2023.02); H04N 25/53 (2023.01); H04N 25/71 (2023.01); H04N 25/75 (2023.01); H10K 30/30 (2023.02); H10K 30/82 (2023.02); H10K 85/211 (2023.02);
Abstract

An organic optoelectronic device comprises a substrate having first and second regions, a first electrode positioned over the first region of the substrate, a shutter electrode positioned over the second region of the substrate, an organic heterojunction layer comprising an organic heterojunction material, positioned over at least a portion of the first electrode, an insulator layer positioned over at least a portion of the shutter electrode, an organic channel layer, comprising an organic channel material, positioned over at least a portion of the heterojunction and insulator layers, and a second electrode positioned over the channel layer in the second region of the substrate, wherein the shutter electrode is configured to generate a repulsive potential barrier in the channel layer, suitable to at least reduce movement of charge in the channel layer. A method of measuring received light in an optoelectronic device is also described.


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