The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2023
Filed:
Jan. 28, 2022
Kohta Aoyagi, Kanagawa, JP;
Tohru Matsumoto, Kanagawa, JP;
Kimiharu Yamazaki, Kanagawa, JP;
Satoshi Nakayama, Kanagawa, JP;
Ryosuke Ebinuma, Tokyo, JP;
Ryoh Ishizuka, Kanagawa, JP;
Tatsuya Ishii, Kanagawa, JP;
Kohta Aoyagi, Kanagawa, JP;
Tohru Matsumoto, Kanagawa, JP;
Kimiharu Yamazaki, Kanagawa, JP;
Satoshi Nakayama, Kanagawa, JP;
Ryosuke Ebinuma, Tokyo, JP;
Ryoh Ishizuka, Kanagawa, JP;
Tatsuya Ishii, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An image abnormality detecting device includes an image reader, an abnormality detector, a pattern holder, and circuitry. The image reader is configured to read an image on a recording medium. The abnormality detector is configured to detect abnormality of the image based on read information of the image on the recording medium, read by the image reader. The pattern holder has a check pattern and is disposed within a reading area of the image reader. The circuitry is configured to inspect a detecting operation of the abnormality detector based on read information of the check pattern read by the image reader.