The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Jan. 24, 2022
Applicant:

Cisco Technology, Inc., San Jose, CA (US);

Inventors:

Abhishek Bhat, Allentown, PA (US);

Romesh Kumar Nandwana, Breinigsville, PA (US);

Assignee:

CISCO TECHNOLOGY, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/091 (2006.01); H03L 7/099 (2006.01);
U.S. Cl.
CPC ...
H03L 7/091 (2013.01); H03L 7/0992 (2013.01);
Abstract

Presented herein are techniques for implementing a differential sub-sampling phase locked loop (PLL). A method includes detecting a common-mode voltage on an output of a differential sub-sampling phase detector operating in the differential sub-sampling phase locked loop, and controlling, based on the common-mode voltage, a duty cycle of a feedback signal of the differential sub-sampling phase locked loop that is fed back to the differential sub-sampling phase detector.


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Bhat, Abhishek. (2023). Calibration loop for differential sub-sampling phase detector in sub-sampling phase locked loop (U.S. Patent No. 11716087). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11716087

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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