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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11715562 B1

PDFFull Text
Date of Patent:
Aug. 01, 2023

Filed:

Jan. 23, 2021

Method for multi-center effect compensation based on pet/ct intelligent diagnosis system

Applicants:

Zhejiang Lab, Zhejiang, CN;

Minfound Medical Systems Co., Ltd, Zhejiang, CN;

Inventors:

Ling Chen, Hangzhou, CN;

Wentao Zhu, Hangzhou, CN;

Bao Yang, Hangzhou, CN;

Fan Rao, Hangzhou, CN;

Hongwei Ye, Hangzhou, CN;

Yaofa Wang, Hangzhou, CN;

Assignees:

ZHEJIANG LAB, Hangzhou, CN;

MINFOUND MEDICAL SYSTEMS CO., LTD, Hangzhou, CN;

Attorney:

W&G Law Group

Primary Examiner:

Ming Y Hon

Int. Cl.
CPC ...
G06V 10/77 (2022.01); G06V 10/84 (2022.01); G06V 10/82 (2022.01); G06V 10/774 (2022.01); G16H 50/20 (2018.01); G06V 10/766 (2022.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G06V 10/766 (2022.01); G06V 10/774 (2022.01); G06V 10/7715 (2022.01); G06V 10/82 (2022.01); G06V 10/84 (2022.01); G06V 2201/03 (2022.01);
Abstract

Disclosed is a method for multi-center effect compensation based on a PET/CT intelligent diagnosis system. The method includes the following steps: estimating multi-center effect parameters of a test center B relative to a training center A by implementing a nonparametric mathematical method for data of the training center A and the test center B based on a location-scale model about additive and multiplicative multi-center effect parameters, and using the parameters to compensate the data of the test center B to eliminate a multi-center effect between the test center B and the training center A. According to the present disclosure, the multi-center effect between the training center A and the test center B can be compensated, so that the compensated data of the test center B can be used in the model trained by the training center A, and the generalization ability of the model is indirectly improved.

Find Patent Forward Citations

Chen, Ling. (2023). Method for multi-center effect compensation based on pet/ct intelligent diagnosis system (U.S. Patent No. 11715562). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11715562

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