The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Jun. 07, 2022
Applicant:

Hefei Core Storage Electronic Limited, Anhui, CN;

Inventors:

Chih-Ling Wang, Anhui, CN;

Yue Hu, Anhui, CN;

Qin Qin Tao, Anhui, CN;

Dong Sheng Rao, Anhui, CN;

Shao Feng Yang, Anhui, CN;

Yang Chen, Anhui, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 16/34 (2006.01); G06F 12/14 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3422 (2013.01); G06F 12/1433 (2013.01); G11C 16/3431 (2013.01); G11C 29/00 (2013.01);
Abstract

A risk assessment method based on data priority, a memory storage device, and a memory control circuit unit are provided. The method includes: receiving a query command from a host system; in response to the query command, performing a data health detection on a rewritable non-volatile memory module, wherein the rewritable non-volatile memory module stores data with multiple data priorities; generating risk assessment information according to a detection result, wherein the risk assessment information reflects a health degree of data with different data priorities in the rewritable non-volatile memory modules by different risk levels; and transmitting the risk assessment information to the host system.


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