The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2023
Filed:
Mar. 13, 2019
Omron Corporation, Kyoto, JP;
Yoshihisa Ijiri, Tokyo, JP;
OMRON Corporation, Kyoto, JP;
Abstract
Provided is a technique capable of generating a discriminator having high inference precision at low cost. An inspection system according to one aspect of the present invention generates, from first image data, plural pieces of second image data of a product; determines, by a first discriminator, whether to adopt each piece of the second image data as learning data; generates a learning data set by the second image data that is determined to be adopted as learning data; constructs, by applying machine learning using the generated learning data set, a second discriminator that determines the acceptability of a product; and uses the constructed second discriminator to determine the acceptability of a product in target image data.