The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Sep. 11, 2020
Applicant:

Beijing Didi Infinity Technology and Development Co., Ltd., Beijing, CN;

Inventors:

Liang Tang, Santa Clara, CA (US);

Bo Tan, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 30/02 (2023.01); G06F 9/54 (2006.01); G06Q 30/0204 (2023.01);
U.S. Cl.
CPC ...
G06Q 30/0204 (2013.01); G06F 9/541 (2013.01);
Abstract

Methods, systems, and apparatus, including computer programs encoded on computer storage media, for testing a plurality of variants among a plurality of users. One of the methods includes: determining a spatial granularity to divide an area into a plurality of grid cells; randomly splitting the plurality of grid cells into a plurality of testing groups, wherein a quantity of the plurality of testing groups is determined based on a quantity of the multiple versions of the feature to be tested; determining a temporal granularity to divide a testing period into a plurality of testing intervals; during each of the plurality of testing intervals, respectively assigning the multiple versions of the feature to the plurality of testing groups; and obtaining a treatment effect for each of the multiple versions of the feature and determining an optimal version of the feature.


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