The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Jul. 10, 2019
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Cheng Zhang, Cambridge, GB;

Yingzhen Li, Cambridge, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06N 3/04 (2023.01); G06N 7/02 (2006.01); G06V 10/80 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/04 (2013.01); G06N 7/023 (2013.01); G06T 2207/20081 (2013.01); G06V 10/811 (2022.01); G06V 10/82 (2022.01);
Abstract

A method comprising: receiving observed data points each comprising a vector of feature values, wherein for each data point, the respective feature values are values of different features of a feature vector. Each observed data point represents a respective observation of a ground truth as observed in the form of the respective values of the feature vector. The method further comprises learning parameters of a machine-learning model based on the observed data points. The machine-learning model comprises one or more statistical models arranged to model a causal relationship between the feature vector and a latent vector, a classification, and a manipulation vector. The manipulation vector represents an effect of potential manipulations occurring between the ground truth and the observation thereof as observed via the feature vector. The learning comprises learning parameters of the one or more statistical models to map between the feature vector, latent vector, classification and manipulation vector.


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