The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2023

Filed:

Jun. 13, 2018
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Geoffrey Ndu, Bristol, GB;

David Altobelli, Houston, TX (US);

Nigel Edwards, Bristol, GB;

Luis Luciani, Jr., Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/554 (2013.01); G06F 21/575 (2013.01); G06F 2221/033 (2013.01);
Abstract

Examples disclosed herein relate to integrity monitoring of a computing system. Trust of state information is verified. Kernel code and module code are loaded into memory that is accessible to a device separate from a processor that loads the kernel code and module code. A measurement module is verified and loaded into memory. The state information can correspond to multiple symbols. The measurement module can measure the state information corresponding to each of the respective symbols to generate a set of initial measurements. The set of initial measurements can be provided to a device for integrity monitoring.


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