The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2023
Filed:
Apr. 30, 2021
Splunk Inc., San Francisco, CA (US);
Jared Breeden, Melbourne, FL (US);
Steven Karis, San Mateo, CA (US);
Amin Moshgabadi, San Diego, CA (US);
Siri Singamneni, Milpitas, CA (US);
Rebecca Tortell, Los Altos, CA (US);
Joshua Vertes, San Diego, CA (US);
Splunk Inc., San Francisco, CA (US);
Abstract
Systems and methods are described for generating metrics from real-time streaming log data. In order to generate the metrics, a metricization rule associated with the log data can be obtained. For example, the metricization rule may be obtained from a user. The metricization rule may include one or more field-value pairs that define how the metrics are generated from the log data. Preview metric data can be generated by applying the metricization rule to the log data. For example, the preview metric data may be displayed via a user interface. Further, the metricization rule can be accepted or approved by the user. Further, the additional log data can be ingested and based on determining that the metricization rule has been accepted, metric data may be generated by applying the metricization rule to the additional log data.