High-speed deserializer with programmable and timing robust data slip function

Abstract

Provided are embodiments for operating a high-speed deserializer. Embodiments can include receiving a clock slip signal to enable operation of the slip pulse generation circuit, and generating a slip pulse signal using the slip pulse-controlled clock generation circuit, wherein the slip pulse signal is programmable to slip one or more bits of a serial input data. Embodiments can also include generating a plurality of deserialization clocks for sampling the serial input data using the slip pulse-controlled clock generation circuit, wherein the plurality of deserialization clocks are generated simultaneously with each other, and providing the plurality of deserialization clocks to the deserializer to selectively sample the serial input data.